This inventor holds 1 USPTO granted patent. Top assignee: Lg Philips Lcd Co., Inc.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Ki Yeon Song: Innovator in Image Quality Analysis
Introduction
Ki Yeon Song is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of display technology, particularly in image quality analysis. His innovative approach has led to the development of a unique method that enhances the evaluation of display devices.
Latest Patents
Ki Yeon Song holds a patent for an "Image quality analysis method and system for a display device using fractal dimension." This patent outlines a comprehensive method for analyzing the image quality of display devices. The process involves outputting an image pattern for analysis, dividing the screen display region into multiple sub-regions, and producing measurement data for each sub-region. The data is then arranged as a time series, from which a fractal dimension exponent is obtained. This exponent serves as a measure of the uniformity of the image quality of the display device.
Career Highlights
Ki Yeon Song is currently employed at LG Philips LCD Co., Inc., where he continues to work on advancements in display technology. His expertise in image quality analysis has positioned him as a valuable asset in the industry.
Collaborations
Throughout his career, Ki Yeon Song has collaborated with notable colleagues, including Don Gyou Lee and Jung Ho Kil. These collaborations have further enriched his work and contributed to the development of innovative solutions in the field.
Conclusion
Ki Yeon Song's contributions to image quality analysis in display technology highlight his innovative spirit and dedication to advancing the industry. His patent reflects a significant step forward in evaluating display devices, showcasing his expertise and commitment to excellence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
