The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Dec. 31, 2002
Don Gyou Lee, Gyeongsangbuk-do, KR;
Jung Ho Kil, Gyeongsangbuk-do, KR;
Ki Yeon Song, Gyeonggi-do, KR;
Moon Chul Jeong, Gyeongsangbuk-do, KR;
Don Gyou Lee, Gyeongsangbuk-do, KR;
Jung Ho Kil, Gyeongsangbuk-do, KR;
Ki Yeon Song, Gyeonggi-do, KR;
Moon Chul Jeong, Gyeongsangbuk-do, KR;
LG.Philips LCD Co., Ltd., Seoul, KR;
Abstract
An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method for a display device includes the steps of outputting an image pattern for analysis of an image quality of the display device, dividing a screen display region to which the image pattern is output into a plurality of sub-regions, producing measurement data representing the image quality with respect to each of the plurality of sub-regions, arranging the produced measurement data as a time series, obtaining a fractal dimension exponent from the data as a time series, and evaluating the fractal dimension exponent as a level of uniformity of the image quality of the display device.