Lg Philips Lcd Co., Inc.

Ki Yeon Song

Don Gyou Lee

Jung Ho Kil

Moon Chul Jeong

An image quality analysis method and an image quality analysis system for a display device are provided. The image quality analysis method for a display device includes the steps of outputting an image pattern for analysis of an image quality of the display device, dividing a screen display region to which the image pattern is output into a plurality of sub-regions, producing measurement data representing the image quality with respect to each of the plurality of sub-regions, arranging the produced measurement data as a time series, obtaining a fractal dimension exponent from the data as a time series, and evaluating the fractal dimension exponent as a level of uniformity of the image quality of the display device.

Growing community of inventors

Gyeonggi-do, South Korea

Ki Yeon Song