Dresden, Germany

Kerst Griesbach

This inventor holds 1 USPTO granted patent. Top assignee: X-Fab Semiconductor Foundries Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kerst Griesbach. Retrieved from https://idiyas.com/inventor/kerst-griesbach

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Kerst Griesbach: Innovator in Semiconductor Technology

Introduction

Kerst Griesbach is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Kerst Griesbach holds a patent titled "Thermopile test structure and methods employing same." This invention involves a semiconductor product that comprises a semiconductor substrate and a test structure. The test structure includes a thermopile and at least one temperature-sensitive element, which is located either in the substrate or between the substrate and the thermopile. This patent showcases his expertise in developing advanced semiconductor solutions.

Career Highlights

Kerst Griesbach is currently employed at X-Fab Semiconductor Foundries GmbH, where he continues to work on cutting-edge semiconductor technologies. His role at the company allows him to apply his innovative ideas and contribute to the advancement of the industry.

Collaborations

Throughout his career, Kerst has collaborated with talented professionals, including Peter Hofmann and Monika Reinhold. These collaborations have further enriched his work and fostered a creative environment for innovation.

Conclusion

Kerst Griesbach is a distinguished inventor whose work in semiconductor technology has led to valuable patents and advancements in the field. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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