This inventor holds 1 USPTO granted patent. Top assignee: Kla Instruments Corporation. Active years: 2000.
Company Filing History:
Years Active: 2000
Title: Kent E Douglas: Innovator in Wafer Inspection Technology
Introduction
Kent E Douglas is a notable inventor based in San Martin, CA (US). He has made significant contributions to the field of wafer inspection technology. His innovative approach has led to the development of a patented method that enhances the accuracy of defect detection in semiconductor manufacturing.
Latest Patents
Kent E Douglas holds a patent for "Alignment correction prior to image sampling in inspection systems." This invention discloses a method and apparatus for inspecting a wafer that defines at least one die. The process begins by obtaining the electronic image equivalent of two dies and determining the x and y offset between those images. Before inspecting for defects, the electronic images are aligned by adjusting their positions. This alignment allows for a more accurate comparison to detect any defects that may exist on one of the dies. He has 1 patent to his name.
Career Highlights
Kent E Douglas is currently employed at Kla Instruments Corporation, where he continues to innovate in the field of inspection systems. His work focuses on improving the reliability and efficiency of semiconductor manufacturing processes.
Collaborations
Kent has collaborated with notable colleagues such as Roger Kroeze and Nicholas Szabo, contributing to advancements in their shared field of expertise.
Conclusion
Kent E Douglas exemplifies the spirit of innovation in the semiconductor industry. His patented technology plays a crucial role in enhancing the accuracy of wafer inspections, ultimately contributing to the advancement of manufacturing processes.