Yokohama, Japan

Kenshi Ishiwatari

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Lasertec Gmbh. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenshi Ishiwatari. Retrieved from https://idiyas.com/inventor/kenshi-ishiwatari

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Kenshi Ishiwatari

Introduction

Kenshi Ishiwatari is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work focuses on enhancing the accuracy of inspection methods, which is crucial in various industrial applications.

Latest Patents

Kenshi Ishiwatari holds a patent for an "Inspection apparatus and inspection method." This invention provides a solution for performing inspections with greater accuracy. The inspection apparatus includes a light source that illuminates a sample with a pattern formed on it. A detector captures the light reflected from the sample, and a processing device analyzes the correlation between the brightness value of the sample image and the dimensions of the pattern. The processing device utilizes a summation value derived from brightness values of sample images obtained under multiple shooting conditions, weighted accordingly.

Career Highlights

Kenshi Ishiwatari is currently employed at Lasertec GmbH, where he continues to develop and refine inspection technologies. His expertise in this area has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Kenshi collaborates with talented coworkers, including Hiroto Nozawa and Kuniaki Takeda. Their combined efforts contribute to the advancement of inspection technologies and the successful implementation of innovative solutions.

Conclusion

Kenshi Ishiwatari's work exemplifies the importance of innovation in inspection technology. His patent reflects a commitment to improving accuracy in industrial inspections, showcasing his role as a significant contributor to the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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