Company Filing History:
Years Active: 2018-2022
Title: Innovations of Kenneth Edward James, Jr.
Introduction
Kenneth Edward James, Jr. is an accomplished inventor based in Morgan Hill, CA (US). He holds a total of 3 patents that showcase his expertise in optical metrology and semiconductor inspection systems. His innovative contributions have significantly advanced the fields in which he operates.
Latest Patents
One of his latest patents is the Vortex Polarimeter. This optical metrology device utilizes a multi-wavelength beam of light with azimuthally varying polarization states, known as a vortex beam. The device focuses this vortex beam on a sample under test across a wide range of angles of incidence. It detects an image of the vortex beam reflected from the sample and measures the polarization state of the return light as a function of the angle of incidence and azimuth angle, which can be further assessed at multiple wavelengths. The vortex beam's azimuthally varying polarization states allow for the measurement of all desired polarization states without the need for moving optical components. The data collected over various angles of incidence and wavelengths enables accurate determination of one or more characteristics of a sample.
Another significant patent is the Active Damper for Semiconductor Metrology and Inspection Systems. This damper consists of a pair of parallel plates containing a fluid with variable viscosity. A wire is positioned between the plates, which may feature intermeshed lands and grooves. A controller adjusts the current to the wire, thereby modifying the electromagnetic field or current through the fluid. This fluid can be a magnetorheological or electrorheological fluid, allowing for variable viscosity based on the applied electromagnetic field or current. The controller's adjustments enable the damping of the semiconductor metrology or inspection system to be altered based on the movement of the stage.
Career Highlights
Kenneth has worked with notable companies such as Onto Innovation Inc. and Kla Tencor Corporation. His experience in these organizations has contributed to his development as a leading inventor in his field.
Collaborations
He has collaborated with talented individuals, including Hidong Kwak and Zhiming Jiang, further enhancing his innovative capabilities.
Conclusion
Kenneth Edward James, Jr. is a prominent inventor whose work in optical metrology and semiconductor inspection systems has led to significant advancements in technology. His patents reflect his commitment to innovation and excellence in his field.