Edmonton, Canada

Kenneth Cadien

This inventor holds 2 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignees: Aurora Control Technologies Inc., Other. Active years: 2014-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenneth Cadien. Retrieved from https://idiyas.com/inventor/kenneth-cadien

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

 

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014-2020

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2 patents (USPTO):Explore Patents

Title: Innovations by Kenneth Cadien

Introduction

Kenneth Cadien is a notable inventor based in Edmonton, Canada. He has made significant contributions to the field of technology with his innovative inventions. With a total of 2 patents, Cadien has focused on developing advanced devices that address critical issues in environmental monitoring and semiconductor technology.

Latest Patents

One of his latest patents is the "Ultrasensitive high Q-factor AT-cut-quartz crystal microbalance femtogram mass sensor." This device is designed to detect environmental contaminants, diseases, and acute medical conditions related to heart failure. It identifies pathogens or troponins before infection or damage to heart muscles using an ultrasensitive high Q-factor AT-cut quartz crystal microbalance (QCM) that can measure from a single picogram to a single femtogram. The device features a set of five disks of a QCM with a 10 mm diameter and a fully coated bottom electrode. The upper electrode has a center dot with varying diameters labeled as 1 mm, 2 mm, 3 mm, 4 mm, and 5 mm. The full coating denotes an electrically continuous thickness of at least one monolayer. Measured parameters from the five disks include Q-factors, impedance, dissipation factors (D), and frequency shift (Δf). Q-factors are utilized to calculate the Allman deviation σ(τ), and measured frequencies are converted to mass sensitivity using the Sauerbrey mass sensitivity coefficient (K).

Another significant patent is the "Non-contact measurement of the dopant content of semiconductor layers." This system and method allow for the non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off the material. The radiation is split into two beams, which pass through pass band filters of differing wavelength ranges. By comparing the energy levels passed through each filter, the dopant content can be calculated by referencing a correlation curve made up of known wafer dopant content for that system.

Career Highlights

Throughout his career, Kenneth Cadien has worked with various companies, including Aurora Control Technologies Inc. His work has significantly impacted the fields of environmental science and semiconductor technology.

Collaborations

Some of his notable coworkers include E Michael Heaven and Gordon Matthew Deans. Their collaboration has contributed to the advancement of innovative technologies in their respective fields.

Conclusion

Kenn

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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