The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10830738 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 10, 2020

Filed:

Nov. 13, 2017
Applicant:

University of Alberta, Edmonton, CA;

Inventors:

Selemani Seif Mziray, Edmonton, CA;

Thomas Thundat, Edmonton, CA;

Kenneth Cadien, Edmonton, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/02 (2006.01); G01N 29/036 (2006.01); G01N 33/543 (2006.01); G01N 29/22 (2006.01); C12Q 1/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2443 (2013.01); C12Q 1/04 (2013.01); G01N 29/022 (2013.01); G01N 29/036 (2013.01); G01N 29/222 (2013.01); G01N 33/5438 (2013.01); G01N 33/54373 (2013.01); G01N 2291/0255 (2013.01); G01N 2291/0256 (2013.01); G01N 2291/0426 (2013.01);
Abstract

A device for detecting environmental contaminants, diseases, and acute medical conditions related to heart failure identifies pathogens or troponins before infection or damage to heart muscles using an ultrasensitive high Q-factor AT-cut quartz crystal microbalance (QCM) that can measure from a single pg to a single fg. The device has a set of five disks of a QCM with a 10 mm diameter and a full coated bottom electrode, with an upper electrode with a center dot with different diameters labelled as 1 mm, 2 mm, 3 mm, 4 mm, and 5 mm. The full coating denoting an electrically continuous thickness of at last one monolayer. Measured parameters from the five disks include Q-factors, impedance, dissipation factors (D) and frequency shift (Δf). Q-factors are used to calculate the Allman deviation σ(τ) and measured frequencies are converted to mass sensitivity using the Sauerbrey mass sensitivity coefficient (K).


Find Patent Forward Citations

Mziray, Selemani. (2020). Ultrasensitive high q-factor at-cut-quartz crystal microbalance femtogram mass sensor (U.S. Patent No. 10830738). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10830738

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