Kanagawa, Japan

Kenji Ogi

This inventor holds 17 USPTO granted patents, primarily in Image Processing Technology. Top assignee: Fuji Xerox Co., Ltd.. Active years: 1993-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Ogi. Retrieved from https://idiyas.com/inventor/kenji-ogi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 64.7

Average Co-Inventor Count = 4.3

ph-index = 6

Forward Citations = 113(Granted Patents)


Location History:

  • Minamiashigara, JP (1995 - 1997)
  • Ebina, JP (1999)
  • Nakai-machi, JP (1998 - 2008)
  • Kanagawa, JP (1993 - 2011)
  • Tokyo, JP (2013)

Company Filing History:


Years Active: 1993-2013

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Areas of Expertise:
Image Forming Apparatus
Color Correction
Image Processing
Thickness Variation Detector
Optical Beam Scanning
Heat Generating Medium
Ink Transfer Medium
Thermal Transfer Recording
17 patents (USPTO):Explore Patents

Title: Kenji Ogi - Innovative Inventor from Kanagawa, JP

Introduction: Kenji Ogi is a renowned inventor hailing from Kanagawa, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenji Ogi holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his diverse range of expertise and creativity.

Career Highlights: With a career spanning over two decades, Kenji Ogi has worked with leading tech companies and research institutions, spearheading projects that have revolutionized various industries.

Collaborations: Throughout his career, Kenji Ogi has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Kenji Ogi's passion for pushing the boundaries of technology and his relentless pursuit of innovation continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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