The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1999
Filed:
Oct. 24, 1996
Applicant:
Inventors:
Akira Ishii, Nakai-machi, JP;
Hideki Moriya, Nakai-machi, JP;
Kenji Ogi, Nakai-machi, JP;
Koichiro Shinohara, Nakai-machi, JP;
Masahiro Takamatsu, Nakai-machi, JP;
Assignee:
Fuji Xerox Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359212 ; 359216 ;
Abstract
In view of realizing higher resolution in the sub-scanning direction and achieving high precision and high quality image formation without generating ununiform distribution of exposure, a scanning surface of a photosensitive material is scanned with an optical beam on sequential parallel linear scanning lines with a predetermined angle for the main scanning direction to form an exposed image thereon.
Ishii, Akira. (1999). Optical beam scanning method and apparatus, and image forming method and (U.S. Patent No. 5877886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5877886
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