The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Jul. 10, 2007
Applicants:

Junichi Ichikawa, Kanagawa, JP;

Kenji Ogi, Kanagawa, JP;

Masao Ito, Kanagawa, JP;

Tomoshi Hara, Kanagawa, JP;

Kenji Hara, Kanagawa, JP;

Yoshifumi Takebe, Kanagawa, JP;

Inventors:

Junichi Ichikawa, Kanagawa, JP;

Kenji Ogi, Kanagawa, JP;

Masao Ito, Kanagawa, JP;

Tomoshi Hara, Kanagawa, JP;

Kenji Hara, Kanagawa, JP;

Yoshifumi Takebe, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/043 (2006.01);
U.S. Cl.
CPC ...
Abstract

A thickness variation detector of a photoconductor includes: a current detection unit that detects a value of current being used for charging a surface of the photoconductor in a state in which a charging unit is in contact with a surface of the photoconductor; and a thickness variation detection unit that detects a thickness variation along a rotation direction of the photoconductor based on the value of current.


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