This inventor holds 2 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2010-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Kure, JP (2010)
- Hiroshima, JP (2013)
Company Filing History:
Years Active: 2010-2013
Title: Kenji Ochi: Innovator in Optical Measurement Technology
Introduction
Kenji Ochi is a notable inventor based in Hiroshima, Japan. He has made significant contributions to the field of optical measurement technology. With a total of 2 patents, Ochi's work focuses on enhancing the precision and efficiency of optical measuring devices.
Latest Patents
Ochi's latest patents include an optical measuring apparatus and an optical measuring machine. The optical measuring apparatus features a measuring apparatus body, a lighting unit, and a lighting controller. The lighting unit is designed to be demountably mounted on the measuring apparatus and utilizes an LED as a light source. The lighting controller manages the lighting unit based on a light intensity command value, ensuring accurate measurements. Additionally, the optical measuring machine comprises a screen with a reference line, a movable stage, and an optical system that forms an optical image of the object being measured. It also includes an edge detecting sensor and a correction data calculator to enhance measurement accuracy.
Career Highlights
Kenji Ochi is currently employed at Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has allowed him to develop innovative solutions that address the challenges faced in optical measurement.
Collaborations
Ochi collaborates with talented coworkers, including Shinji Takahashi and Naoya Kikuchi. Their combined expertise contributes to the advancement of measurement technologies.
Conclusion
Kenji Ochi's contributions to optical measurement technology through his patents and work at Mitutoyo Corporation highlight his role as an influential inventor in this field. His innovations continue to pave the way for advancements in precision measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
