The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2010

Filed:

Jul. 25, 2007
Applicants:

Kenji Ochi, Kure, JP;

Naoya Kikuchi, Utsunomiya, JP;

Shinji Takahashi, Utsunomiya, JP;

Inventors:

Kenji Ochi, Kure, JP;

Naoya Kikuchi, Utsunomiya, JP;

Shinji Takahashi, Utsunomiya, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measuring device includes: a screen having a reference line; a movable stage; an optical system for forming on the screen an optical image of a to-be-measured object placed on the stage; and an edge detecting sensor () for detecting a passage of a measurement edge of the optical image at an arbitrary position on the screen. The optical measuring device further includes: an offset value storage () storing a distance between the reference line and the edge detecting sensor () as an offset value; and a correction data calculator () for correcting measurement data measured with the reference line and the edge detecting sensor () by use of the offset value.


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