Kawasaki, Japan

Kenichi Komiya

This inventor holds 61 USPTO granted patents and 6 published patent applications and 1 EPO patent, primarily in Image Formation Technology (CPC class B41J). Top assignees: Kabushiki Kaisha Toshiba, Toshiba Tec Kabushiki Kaisha, Other. Active years: 1994-2025.

USPTO Granted Patents = 61 

% Patents Active = 65.6


Average Co-Inventor Count = 3.6

ph-index = 10

Forward Citations = 268(Granted Patents)

Forward Citations (Not Self Cited) = 223(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Yokohama, JP (1995)
  • Kawasaki, JP (1994 - 2010)
  • Kanagawa-ken, JP (1998 - 2014)
  • Kanagawa, JP (1994 - 2019)

Company Filing History:


Years Active: 1994-2025

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Areas of Expertise:
Image Forming Apparatus
Light Beam Scanning
Laser Control Circuit
Distance Measurement
Vibration Measurement
Noncontact Deformation Detection
Crack Monitoring
Optical Print Head
Medium Transport Unit
Parametric Speaker
Two-Dimensional Scanning
Multi-Layer Mirror Structure
61 patents (USPTO):Explore Patents

Title: **Kenichi Komiya: An Innovator in Non-Contact Measurement Technologies**

Introduction

Kenichi Komiya, a prolific inventor based in Kawasaki, Japan, holds an impressive portfolio of 60 patents. His work primarily focuses on innovative solutions for deformation detection and crack monitoring. With a background in renowned companies, his contributions have significantly impacted technology in these fields.

Latest Patents

Among his latest advancements, Komiya has developed a **Noncontact Deformation Detecting Device with Inclination Measurement**. This device features a vibration module that operates in a non-contact manner to measure deformation in various objects. It includes a transmission time measurement module that assesses the time taken for vibrations to travel between two points without contact. Additionally, the device has an inclination measurement module that gauges the angle of the measuring plane against a reference surface, allowing for accurate deformation assessments.

Another remarkable invention is the **Crack Sensor and Crack Monitoring Device**. This device utilizes an insulator base material and includes a common line and multiple gauge lead wires designed to detect the propagation of cracks. The unique configuration of the extending ends of the gauge lead wires enhances its monitoring capabilities, proving essential for structural integrity assessments.

Career Highlights

Kenichi Komiya has made noteworthy contributions while employed at companies such as Toshiba Corporation and Toshiba Tec Corporation. His experience in these prestigious organizations has undoubtedly shaped his expertise and innovative mindset, enabling him to spearhead advancements in measurement technologies.

Collaborations

Throughout his career, Komiya has collaborated with talented individuals, including Koji Tanimoto and Daisuke Ishikawa. These partnerships have fostered a creative environment, allowing the exchange of ideas and leading to the successful development of his various patents.

Conclusion

Kenichi Komiya's extensive work in the field of non-contact measurement technologies showcases his dedication to innovation. With a solid foundation built on valuable experience and collaborations, his patents stand as a testament to his remarkable contributions to technology and engineering. As he continues to explore new possibilities, the impact of his inventions will likely inspire future generations of inventors.

Profile summary based on public USPTO records.
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