The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Dec. 28, 2015
Applicant:

Toshiba Tec Kabushiki Kaisha, Shinagawa-ku, Tokyo, JP;

Inventors:

Daisuke Ishikawa, Shizuoka, JP;

Kenichi Komiya, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/11 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01N 21/1702 (2013.01); G01N 29/11 (2013.01); G01N 2291/017 (2013.01);
Abstract

A vibration measuring apparatus comprises a wave transmission section configured to vibrate a measurement object with sound wave output from a parametric speaker towards the measurement object and an optical measurement section configured to emit laser light towards the measurement object, receive the laser light reflected from the measurement object and measure vibration of the assumed object (measurement object) according to the received laser light. The wave transmission section and the optical measurement section are mounted integrally, and the optical measurement section makes an optical axis of laser light emitted to/received from the measurement object coincident with a central axis of the sound wave output from the parametric speaker.


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