The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Dec. 13, 2016
Toshiba Tec Kabushiki Kaisha, Shinagawa-ku, Tokyo, JP;
Kenichi Komiya, Kanagawa, JP;
Daisuke Ishikawa, Shizuoka, JP;
TOSHIBA TEC KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A deformation detecting device comprises a vibration module configured to vibrate a first point of a measuring plane of a measured object in a non-contact manner; a transmission time measurement module configured to measure transmission time of vibration from the first point to a second point of the measuring plane in a non-contact manner; an inclination measurement module configured to measure an inclination of the measuring plane to a reference surface in a non-contact manner; and a determination module configured to determine presence/absence of deformation in the measured object by comparing the transmission time with reference transmission time serving as transmission time of vibration from the first point to the second point in a case in which there is no inclination of the measuring plane and corrects the reference transmission time in response to the inclination of the measuring plane.