Company Filing History:

10 out of 12,872

Advanced Micro Devices Corporation

Years Active: 2003-2010

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14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7672803 - Input of test conditions and output generation for built-in self test (2010-03-02),

2. 7415646 - [object Object] (2008-08-19),

3. 7284167 - Automated tests for built-in self test (2007-10-16),

4. 7158442 - Flexible latency in flash memory (2007-01-02),

5. 7028240 - Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machine (2006-04-11),

6. 7010736 - Address sequencer within BIST (Built-in-Self-Test) system (2006-03-07),

7. 6980473 - Memory device and method (2005-12-27),

8. 6973003 - Memory device and method (2005-12-06),

9. 6970368 - CAM (content addressable memory) cells as part of core array in flash memory device (2005-11-29),

10. 6891752 - System and method for erase voltage control during multiple sector erase of a flash memory device (2005-05-10),

11. 6771093 - Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductor (2004-08-03),

12. 6707718 - Generation of margining voltage on-chip during testing CAM portion of flash memory device (2004-03-16),

13. 6665214 - On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode (2003-12-16),

14. 6631086 - On-chip repair of defective address of core flash memory cells (2003-10-07),

Title: Ken Cheong Cheah: Innovating Flash Memory Technology

Introduction

Ken Cheong Cheah, an accomplished inventor based in Penang, Malaysia, has made significant contributions to the field of flash memory technology. With an impressive portfolio of 14 patents, Cheah's work primarily focuses on enhancing the efficiency and reliability of built-in self-test (BIST) systems for flash memory devices.

Latest Patents

Cheah's latest patents illustrate his innovative approach to testing and erasing processes in flash memory. One notable invention discusses a system and method for providing programmable test conditions for a BIST circuit of a flash memory device. This invention utilizes a flash memory equipped with a BIST circuit to conduct thorough testing while employing a BIST interface circuit that can adjust test conditions, thereby allowing for effective results based on various global variables.

Another significant patent introduces methods for performing sector erases of flash memory devices that incorporate BIST circuitry. This involves an interactive algorithm that not only verifies but also repeatedly erases sectors until specific conditions are met. By employing a dual verification and erase operation, Cheah's approach ensures that each word of the sector is thoroughly addressed, enhancing the device's reliability.

Career Highlights

Throughout his career, Ken Cheong Cheah has held pivotal roles in notable technology companies, including Advanced Micro Devices Corporation and Spansion LLC. His experience in these organizations has undoubtedly influenced his innovative contributions to flash memory technology.

Collaborations

In the course of his professional journey, Cheah has collaborated with esteemed colleagues such as Edward V Bautista, Jr. and Darlene G Hamilton. Their combined expertise in technology development has likely played a crucial role in advancing Cheah's patented inventions.

Conclusion

Ken Cheong Cheah continues to be a driving force in the innovation of flash memory technology. His substantial patent portfolio, collaborative efforts, and dedication to improving memory testing processes underscore his importance as an inventor in the tech landscape. As technology evolves, the contributions of innovators like Cheah pave the way for future advancements in memory solutions.

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