Beaverton, OR, United States of America

Keith D Rule

USPTO Granted Patents = 14 

 

Average Co-Inventor Count = 3.2

ph-index = 4

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2009-2025

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14 patents (USPTO):Explore Patents

Title: Innovations of Keith D Rule

Introduction

Keith D Rule is a notable inventor based in Beaverton, OR (US). He has made significant contributions to the field of technology, holding a total of 14 patents. His work primarily focuses on methods and systems for managing waveform data and synchronizing tasks in test and measurement systems.

Latest Patents

One of his latest patents is titled "Method of generating metadata from acquired signals for search, filtering, and machine learning inputs." This invention involves a computing device that connects to a network and utilizes processors to determine when a new waveform is added to a repository. It performs measurements on the waveform, attaches the results as metadata, and stores both the waveform and metadata in the repository. Another significant patent is "Multi-instrument behavior synchronization using jobs and milestones." This method synchronizes tasks in a test and measurement system by creating jobs associated with tasks and managing their execution through a job manager.

Career Highlights

Keith has worked with Tektronix, Inc., an Oregon US Corporation, where he has contributed to various innovative projects. His experience in the industry has allowed him to develop advanced technologies that enhance the efficiency of test and measurement systems.

Collaborations

Throughout his career, Keith has collaborated with notable professionals such as Scott Ketterer and Edward F Tanous. These collaborations have further enriched his work and contributed to the development of his patents.

Conclusion

Keith D Rule is a distinguished inventor whose work has significantly impacted the technology sector. His innovative patents and career achievements reflect his dedication to advancing the field of test and measurement systems.

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