The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2012
Filed:
Jan. 25, 2008
Keith D. Rule, Beaverton, OR (US);
Thomas L. Freeman, Beaverton, OR (US);
Daniel E. Taylor, Beaverton, OR (US);
Timothy D. Margeson, Vancouver, WA (US);
Scott R. Ketterer, Beaverton, OR (US);
Keith D. Rule, Beaverton, OR (US);
Thomas L. Freeman, Beaverton, OR (US);
Daniel E. Taylor, Beaverton, OR (US);
Timothy D. Margeson, Vancouver, WA (US);
Scott R. Ketterer, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method of analysis of long record length data using mark duration includes displaying together with a portion of the long record length data each mark that identifies a specified feature of interest together with the mark duration. Associated with the mark may be text identifying the feature of interest, measurement values associated with the duration of the mark, or a combination thereof. Multiple sets of marks may be generated for the long record length data, which sets may be combined to generate new marks with duration. The marks also may be filtered to further refine the marks to be displayed according to user specified criteria. In this way analysis of long record length data representing an acquired signal may be readily automated so a user may move from one interesting event to another without having to pan through the long record length data.