The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2011
Filed:
Sep. 08, 2008
Method of processing waveform data from one or more channels using a test and measurement instrument
Keith D. Rule, Beaverton, OR (US);
Mehrab Sedeh, Beaverton, OR (US);
Robert D. Twete, Beaverton, OR (US);
Tristan A. Robinson, Beaverton, OR (US);
Keith D. Rule, Beaverton, OR (US);
Mehrab Sedeh, Beaverton, OR (US);
Robert D. Twete, Beaverton, OR (US);
Tristan A. Robinson, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
The method of processing waveform data from one or more channels using a test and measurement instrument, such as an oscilloscope, is described in which waveform data is collected from a DUT; defining a context is defined by instructing the instrument to obtain the focus of each waveform datum having a first user-defined attribute; defining a selection criteria by instructing the instrument to obtain the focus of each waveform datum having both a first user-defined attribute and a second user-defined attribute; and defining an action by instructing the instrument to perform an operation responsive to finding at least one waveform datum having both the first user-defined attribute and the second user-defined attribute.