Company Filing History:
3 out of 10,346 
2 out of 71 
1 out of 80 
Years Active: 1990-1995
Title: Keiichi Yokota: Innovator in Probe Technology
Introduction
Keiichi Yokota is a notable inventor based in Nirasaki, Japan. He has made significant contributions to the field of semiconductor testing technology, holding a total of 5 patents. His work focuses on improving the efficiency and effectiveness of probe apparatuses used in measuring electrical characteristics of semiconductor devices.
Latest Patents
One of Yokota's latest inventions is a probe apparatus designed for measuring electrical characteristics of objects. This innovative device features a contact ring with probe pins mounted on the top surface of a casing, allowing for precise positioning of a wafer holder table located below. The design includes a holder member that can move freely into and out of the space between the probe pins and the wafer holder table. This setup enables the operator to view images of the probe pins and the electrode pads of an integrated circuit chip on the wafer through a camera, facilitating easier and more accurate positioning without the need for a separate positioning region. Another significant patent is a probe card used in probing test machines. This probe card sends and receives test signals to examine the electrical characteristics of circuits through pads of a semiconductor chip. It consists of a supporting plate, a flexible printed circuit base, and contactors that improve the contact with the pads through elastic deformation of a cushioning medium.
Career Highlights
Throughout his career, Keiichi Yokota has worked with prominent companies in the semiconductor industry, including Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His experience in these organizations has allowed him to develop and refine his innovative technologies.
Collaborations
Yokota has collaborated with notable coworkers such as Shigeoki Mori and Wataru Karasawa, contributing to advancements in probe technology and semiconductor testing.
Conclusion
Keiichi Yokota's contributions to the field of semiconductor testing through his innovative patents and collaborations have significantly impacted the industry. His work continues to influence the design and functionality of probe apparatuses, enhancing the efficiency of electrical measurements in semiconductor devices.