Suita, Japan

Keiichi Furukawa

This inventor holds 21 USPTO granted patents. Top assignees: Minolta Company, Ltd., Konica-Minolta Holdings, Inc., Koyo Seiko Company, Ltd.. Active years: 1989-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keiichi Furukawa. Retrieved from https://idiyas.com/inventor/keiichi-furukawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 71.4

Average Co-Inventor Count = 2.9

ph-index = 8

Forward Citations = 204(Granted Patents)


Location History:

  • Ikoma-gun, JP (2003)
  • Osaka, JP (1989 - 2006)
  • Suita, JP (1999 - 2007)
  • Tokyo, JP (2011 - 2012)
  • Hachioji, JP (2012 - 2014)

Company Filing History:


Years Active: 1989-2014

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21 patents (USPTO):Explore Patents

Title: Keiichi Furukawa: Pioneering Inventor from Suita

Introduction: Keiichi Furukawa is a renowned inventor hailing from Suita, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Furukawa's latest patents include advancements in artificial intelligence algorithms for autonomous vehicles, wearable technology for healthcare monitoring, and sustainable energy solutions.

Career Highlights: With over two decades of experience in research and development, Furukawa has worked with leading tech companies to bring cutting-edge products to the market. His expertise lies in robotics, IoT, and renewable energy technologies.

Collaborations: Furukawa has collaborated with top universities and research institutions worldwide, fostering a culture of innovation and knowledge sharing. His partnerships have led to the development of revolutionary products that have impacted various industries.

Conclusion: Keiichi Furukawa's passion for innovation and his relentless pursuit of excellence have solidified his position as a trailblazer in the world of technology. His work continues to inspire future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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