The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2014

Filed:

May. 11, 2010
Applicants:

Keiichi Furukawa, Hachioji, JP;

Kuniaki Uezawa, Ome, JP;

Toshiyuki Kinoshita, Hino, JP;

Inventors:

Keiichi Furukawa, Hachioji, JP;

Kuniaki Uezawa, Ome, JP;

Toshiyuki Kinoshita, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01);
Abstract

In an organic EL panel inspection method, to determine whether an organic EL panel is good or bad, a plurality of voltages having different values are sequentially applied to the organic EL panel, thereby measuring the respective currents. According to the currents, the following three criteria are checked: criterion (1), whether or not a spike current is present in the measured currents, criterion (2), between when the plurality of voltages are sequentially applied from one direction to the other direction of the voltage and when the plurality of voltages are sequentially applied from the other direction to the one direction, whether or not currents having different current densities occur at the same voltage, and criterion (3), the absolute value of the current density of current flowing when a predetermined voltage in the reverse direction is applied to the organic EL panel.


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