Tokyo, Japan

Kei Shomura

This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Jfe Steel Corporation. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kei Shomura. Retrieved from https://idiyas.com/inventor/kei-shomura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 75.0

 

Average Co-Inventor Count = 2.6

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2024-2026

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4 patents (USPTO):Explore Patents

Title: Kei Shomura: Innovator in Manufacturing Process Diagnosis

Introduction

Kei Shomura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of manufacturing process diagnosis through his innovative designs. With a total of 4 patents, Shomura has established himself as a key figure in his industry.

Latest Patents

Shomura's latest patents include a display screen or portion thereof with a graphical user interface specifically designed for a manufacturing process status diagnosis display device. This invention aims to enhance the efficiency and accuracy of monitoring manufacturing processes.

Career Highlights

Kei Shomura is currently employed at JFE Steel Corporation, where he applies his expertise in developing advanced manufacturing technologies. His work has been instrumental in improving operational processes within the company.

Collaborations

Shomura has collaborated with notable colleagues, including Masafumi Matsushita and Takehide Hirata, to further advance innovations in their field.

Conclusion

Kei Shomura's contributions to manufacturing process diagnosis through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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