The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Oct. 04, 2021
Jfe Steel Corporation, Tokyo, JP;
Takehide Hirata, Tokyo, JP;
Kei Shomura, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
An abnormality determination apparatus: performs, during normal operation of the facility, K times of clipping from time-series signals indicating an operation state of the facility; sets M types as types of the time-series signals clipped by the time-series signal clipping unit, constructs an M-dimensional vector, and registers the constructed vector as a normal vector; sets an abnormality determination flag as a first type when a maximum value of correlation between variables is less than a predetermined value, sets an abnormality determination flag as a second type when the maximum value is the predetermined value or more, and performs, when the flag is of the second type, a principal component analysis on a registered normal vector group to calculate a transform coefficient of a principal component and registers each of the calculated transform coefficients as an abnormality determination model; and determines an abnormality of the facility.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile