The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Dec. 08, 2020
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Kei Shomura, Tokyo, JP;

Takehide Hirata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G06N 20/00 (2019.01);
Abstract

A trigger condition determination method for a time series signal determines a trigger condition for cutting out a monitored section being a target for abnormality diagnosis, from a monitored signal being a time series signal indicating a condition of a monitored facility in the abnormality diagnosis for the monitored facility, and includes: collecting signal groups including one or more monitored signals and a trigger candidate signal; cutting out the monitored section of the monitored signal; generating a learning model specifying a start time point of the cut-out monitored section, generating label data, and using one or more trigger candidate signals at each time point as an input and using the label data at each time point as an output, by using machine learning; and determining the trigger condition by using the learning model, for the monitored signal for which the abnormality diagnosis is performed.


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