Yamato, Japan

Kazunari Ishii


Average Co-Inventor Count = 2.4

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1995-2022

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2 patents (USPTO):Explore Patents

Title: Kazunari Ishii: Innovator in Profile Measurement Technology

Introduction

Kazunari Ishii is a notable inventor based in Yamato, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patents. With a total of two patents to his name, Ishii has demonstrated a commitment to advancing engineering solutions.

Latest Patents

Ishii's latest patents include a profile measuring machine and a profile measuring method. The profile measuring machine is designed to measure the profile of a workpiece that has both known and unknown profile portions. This machine features a scanning probe with a contact piece that interacts with the workpiece, a drive mechanism for moving the probe, and an autonomous scanning measurement unit that controls the drive mechanism for precise measurements. The measurement-path calculator plays a crucial role by determining the movement path based on the measurement results of the unknown-profile portions and the design data of the known-profile portions. Additionally, he has developed a connector for building units, which connects a column with two beams. This connector comprises a core portion that matches the column's sectional shape and a branch portion that includes a web and parallel flanges, ensuring a secure connection.

Career Highlights

Throughout his career, Kazunari Ishii has worked with prominent companies such as Misawa Homes Co., Ltd. and Mitutoyo Corporation. His experience in these organizations has allowed him to refine his skills and contribute to various engineering projects.

Collaborations

Ishii has collaborated with notable coworkers, including Katsuyuki Chihara and Akira Kishi. These partnerships have likely enriched his work and fostered innovation in his projects.

Conclusion

Kazunari Ishii's contributions to measurement technology through his patents reflect his dedication to innovation and engineering excellence. His work continues to influence the field and inspire future advancements.

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