The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Jul. 21, 2020
Mitutoyo Corporation, Kawasaki, JP;
Kazunari Ishii, Yamato, JP;
Fumihiro Takemura, Kawasaki, JP;
MITUTOYO CORPORATION, Kawasaki, JP;
Abstract
A profile measuring machine is for measuring a profile of a workpiece having a plurality of known-profile portions and a plurality of unknown-profile portions, the known-profile portions being cyclically arranged via the respective unknown-profile portions. The profile measuring machine includes: a scanning probe having a contact piece capable of being in contact with the workpiece; a drive mechanism for moving the scanning probe; an autonomous scanning measurement unit for controlling the drive mechanism to perform the autonomous scanning measurement; a measurement-path calculator for calculating a movement path of the scanning probe; and a nominal-value scanning measurement unit for controlling the drive mechanism to move the scanning probe along the movement path to perform a nominal-value scanning measurement. The measurement-path calculator calculates the movement path for the workpiece based on measurement results of the unknown-profile portions measured by the autonomous scanning measurement unit and design data of the known-profile portions.