Ibaraki-ken, Japan

Kazuhiro Sano


Average Co-Inventor Count = 3.8

ph-index = 2

Forward Citations = 75(Granted Patents)


Location History:

  • Ibaraki, JP (1995)
  • Naka-machi, JP (1999)
  • Ibaraki-ken, JP (2001)

Company Filing History:


Years Active: 1995-2001

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3 patents (USPTO):Explore Patents

Title: Kazuhiro Sano: Innovator in Particle Image Analysis

Introduction

Kazuhiro Sano is a notable inventor based in Ibaraki-ken, Japan. He has made significant contributions to the field of particle image analysis, holding a total of 3 patents. His work focuses on developing advanced apparatuses that enhance the accuracy and efficiency of particle classification.

Latest Patents

One of Sano's latest patents is a particle image analyzing apparatus designed for high-classifying accuracy and efficiency. This apparatus allows for the setting of criteria to determine whether fine classification is necessary for various facilities, such as hospitals. The system includes a rough classification unit that executes initial particle classification and supplies the results to a fine classification necessity determination unit. This unit compares the rough classification results with stored reference values to ascertain whether fine classification is required. If needed, it instructs an image processing control circuit to carry out fine classification, ensuring that the results are accurate and reliable.

Another significant patent is the flow type particle image analytical method and apparatus. This innovative method involves feeding a particles-suspended sample surrounded by a cleaning solution, imaging the particles by irradiating light, and automatically classifying them through analysis of the captured images. The system includes features for designating specific particle types for review, storing classified particles in a memory, and displaying them for operator classification. This method streamlines the process of particle analysis, making it more efficient and user-friendly.

Career Highlights

Kazuhiro Sano is currently employed at Hitachi, Ltd., where he continues to develop innovative solutions in particle image analysis. His work has significantly impacted the field, providing tools that enhance the accuracy of particle classification in various applications.

Collaborations

Sano has collaborated with notable colleagues, including Hideki Asai and Norio Oowada. Their combined expertise has contributed to the advancement of technologies in particle image analysis.

Conclusion

Kazuhiro Sano's contributions to particle image analysis through his innovative patents demonstrate his commitment to enhancing classification accuracy and efficiency. His work at Hitachi, Ltd. and collaborations with esteemed colleagues further solidify his position as a leading inventor in this field.

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