The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 1999

Filed:

Jan. 23, 1996
Applicant:
Inventors:

Hideyuki Horiuchi, Abiko, JP;

Hideki Asai, Mito, JP;

Yasuaki Kojima, Hitachinaka, JP;

Norio Oowada, Hitachinaka, JP;

Kazuhiro Sano, Naka-machi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382133 ; 382224 ; 702 21 ;
Abstract

A flow type particle image analytical method for feeding a particles-suspended sample by surrounding it by a cleaning solution, imaging particles in the sample by irradiating light to it, and automatically classifying the particles in the sample by analyzing the picked-up particle images, wherein the method comprises a means for designating the kind of particles to be reviewed beforehand among the classified particles, a means for storing only particles which are automatically classified to the designated particle kind in a review image memory, a means for displaying particles of the same kind on a CRT display in batch so as to review particle images, and a means for classifying each of the displayed particles finally by an operator or for changing the particle name.


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