The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1995
Filed:
Oct. 18, 1993
Hitachi, Ltd., Tokyo, JP;
Abstract
A liquid sample automatic analyzer is achieved in which if any test strip is not placed at a photometric position for such a reason that a test strip automatic supply device has failed to supply the test strip, this failure is detected to enable automatic judgment on that the measured results of examination correspond to which samples. A presence/absence detector is provided in the test strip automatic supply device, and a pressure detector for detecting whether the test strip is gripped or not is provided in a grip device. Detection signals from the presence/absence detector and the pressure detector are supplied to a control unit. Based on those detection signals, the control unit determines a failure in taking out or gripping the test strip, if occurs. Accordingly, even when the test strip is not placed at the photometric position in the measuring device and a vacant position occurs, this occurrence of the vacant position is detected to enable the analyzer to automatically and correctly judge that the measured results of examination correspond to which samples.