Company Filing History:
2 out of 10,295 
1 out of 1 Years Active: 2018-2019
Title: Kazuhiko Koshimizu: Innovator in Probe Technology
Introduction
Kazuhiko Koshimizu is a notable inventor based in Beaverton, OR (US). He has made significant contributions to the field of probe technology, holding 2 patents that showcase his innovative approach to imaging and inspection methods in semiconductor devices.
Latest Patents
Koshimizu's latest patents include a probe apparatus and a probe method. The probe apparatus features a stage that is movable in both horizontal and vertical directions. It incorporates a first and a second imaging device, along with their respective optical units, and a projection optical unit. The first imaging device captures an image of a probe needle that contacts an electrode of a device on a substrate's surface. The second imaging device captures an image of the electrode held on the stage. The projection optical unit projects an optical target mark for position alignment of the imaging devices.
His second patent focuses on a position accuracy inspecting method and apparatus. This innovation inspects the contact position of a probe needle with respect to electrode pads of a semiconductor device. A reticle indicating the positions of the probe needles is used in place of the actual needles during inspection. The semiconductor device is imaged through the reticle, allowing for analysis of the positional relationship between the shapes on the reticle and the electrode pads. Adjustments to the stage position are made as necessary to ensure alignment.
Career Highlights
Kazuhiko Koshimizu has worked with prominent companies in the industry, including Tokyo Electron Limited and Seiwa Optical Co., Ltd. His experience in these organizations has contributed to his expertise in probe technology and semiconductor inspection methods.
Collaborations
Throughout his career, Koshimizu has collaborated with notable colleagues such as Muneaki Tamura and Shinji Akaike. These collaborations have likely enriched his work and led to advancements in the field.
Conclusion
Kazuhiko Koshimizu is a distinguished inventor whose work in probe technology has made a significant impact on semiconductor device inspection. His innovative patents reflect his dedication to advancing the field and improving accuracy in technology.
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