This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Katsuo Oki: Innovator in Inspection Technology
Introduction
Katsuo Oki is a notable inventor based in Kasama, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent that enhances the efficiency of current detection in vacuum environments.
Latest Patents
Katsuo Oki holds a patent for an inspection device designed to prevent electric discharge, thereby allowing for more efficient detection of absorbed current. The invention features absorbed current detectors mounted in a vacuum specimen chamber, where the capacitance of the signal wire from each probe to the corresponding absorbed current detector is minimized to the order of picofarads. This design enables the detection of high-frequency absorbed current signals, reaching tens of kilohertz or higher. Additionally, the device includes signal selectors operated by a signal selection controller, which connects the signal lines of a semiconductor parameters analyzer to the probes in contact with the sample. This innovation allows for the measurement of electrical characteristics of samples without limitations on signal paths. Furthermore, each probe stage or sample stage is equipped with a resistance to manage slow leakage of electric charge.
Career Highlights
Katsuo Oki is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing inspection technologies. His work has contributed to the development of devices that improve the accuracy and efficiency of electrical measurements in various applications.
Collaborations
Throughout his career, Katsuo Oki has collaborated with esteemed colleagues, including Mitsuhiro Nakamura and Hiroshi Toyama. These partnerships have fostered innovation and the sharing of expertise in the field of inspection technology.
Conclusion
Katsuo Oki's contributions to inspection technology through his innovative patent demonstrate his commitment to enhancing the efficiency of electrical measurements. His work continues to influence advancements in the field, showcasing the importance of innovation in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
