Tokyo, Japan

Katsuo Asakura

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Jeol Ltd.. Active years: 2006-2026.


% Patents Active = 50.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2006-2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Katsuo Asakura in NMR Measurement Optimization

Introduction

Katsuo Asakura is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of nuclear magnetic resonance (NMR) measurement. His innovative approach has led to the development of a method that optimizes measurement conditions, enhancing the reliability of NMR data.

Latest Patents

Katsuo Asakura holds a patent for a method of optimizing NMR measurement conditions. This patent outlines a systematic approach to finding a reliable optimum value for measurement conditions in NMR. The method involves collecting NMR measurement data while varying the measurement condition. A numerical value is extracted from the data, and a curve is created to represent the relationship between the measurement data and the condition. By establishing a model equation and performing curve fitting, Asakura's method determines the optimum value of the measurement condition.

Career Highlights

Asakura is associated with Jeol Ltd., a company known for its advanced scientific instruments. His work at Jeol Ltd. has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of NMR technology.

Collaborations

Throughout his career, Katsuo Asakura has collaborated with esteemed colleagues such as Tomomitsu Kurimoto and Nobuaki Nemoto. These collaborations have fostered a productive environment for innovation and research.

Conclusion

Katsuo Asakura's contributions to NMR measurement optimization exemplify the impact of innovative thinking in scientific research. His patent reflects a significant advancement in the field, showcasing his dedication to improving measurement techniques.

Profile summary based on public USPTO records.
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