The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Apr. 28, 2004
Tomomitsu Kurimoto, Tokyo, JP;
Nobuaki Nemoto, Kanagawa, JP;
Katsuo Asakura, Tokyo, JP;
Chiharu Yamasaki, Tokyo, JP;
Tomomitsu Kurimoto, Tokyo, JP;
Nobuaki Nemoto, Kanagawa, JP;
Katsuo Asakura, Tokyo, JP;
Chiharu Yamasaki, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
There is disclosed a method of finding a reliable optimum value of a measurement condition in an NMR measurement. This method starts with gaining NMR measurement data while varying the value of the measurement condition to be optimized. Then, a certain property is extracted as a numerical value from the measurement data. A plot is made of the measurement data versus the value of the measurement condition to create a curve. A model equation coincident with the measurement condition, its range, and the certain property extracted as a numerical value is established. Curve fitting is done in which constants of the model equation are varied such that the equation agrees the created curve. The constant values of the model equation and their standard deviation are obtained by curve fitting. An optimum value of the measurement condition is obtained from the results.