Olching, Germany

Kathrin Mohler


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Kathrin Mohler: Innovator in Electron Beam Technology

Introduction

Kathrin Mohler is a prominent inventor based in Olching, Germany. He has made significant contributions to the field of electron beam technology, particularly through his innovative methods for forming multipole devices. His work has implications for various applications in semiconductor testing and materials science.

Latest Patents

Kathrin Mohler holds a patent for a "Method of forming a multipole device, method of influencing an electron beam, and multipole device." This patent describes a method for influencing an electron beam using an electron beam apparatus that includes an aperture body with at least one aperture opening. The method involves directing the electron beam onto multiple surface portions of the aperture body to create an electron beam-induced deposition pattern. This pattern is designed to function as a multipole in a charged state, specifically as a quadrupole, hexapole, or octupole. The deposition pattern can consist of carbon or carbonaceous materials, enhancing the functionality of the multipole device in electron beam applications.

Career Highlights

Kathrin Mohler is associated with Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh, where he applies his expertise in semiconductor testing technologies. His innovative approaches have positioned him as a key figure in the development of advanced electron beam apparatuses.

Collaborations

Kathrin has collaborated with notable colleagues, including John Breuer and Dominik Patrick Ehberger. Their combined efforts contribute to the advancement of technologies in the field of semiconductor testing and electron beam applications.

Conclusion

Kathrin Mohler's contributions to electron beam technology and his innovative patent highlight his role as a significant inventor in the field. His work continues to influence advancements in semiconductor testing and materials science.

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