Darmstadt, Germany

Katharina Gries

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Carl Zeiss Smt Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katharina Gries. Retrieved from https://idiyas.com/inventor/katharina-gries

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Katharina Gries: Innovator in Charged Particle Examination

Introduction

Katharina Gries is a prominent inventor based in Darmstadt, Germany. She has made significant contributions to the field of charged particle examination, showcasing her expertise and innovative spirit.

Latest Patents

Katharina holds a patent for a "Method and apparatus for examining a beam of charged particles." This invention relates to a method for examining a beam of charged particles, which includes producing persistent interactions of the beam with a sample at multiple positions relative to the beam. By analyzing the spatial distribution of these interactions, she derives at least one property of the beam.

Career Highlights

Katharina is currently employed at Carl Zeiss SMT GmbH, where she continues to push the boundaries of technology in her field. Her work has been instrumental in advancing methods for particle examination, contributing to both academic and practical applications.

Collaborations

She collaborates with notable colleagues, including Daniel Rhinow and Markus Bauer, who share her commitment to innovation and excellence in research.

Conclusion

Katharina Gries exemplifies the spirit of innovation in the realm of charged particle examination. Her contributions through her patent and work at Carl Zeiss SMT GmbH highlight her role as a leading inventor in her field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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