Santa Clara, CA, United States of America

Kara Lee Sherman

This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kara Lee Sherman. Retrieved from https://idiyas.com/inventor/kara-lee-sherman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations by Kara Lee Sherman

Introduction

Kara Lee Sherman is an accomplished inventor based in Santa Clara, CA (US). She has made significant contributions to the field of semiconductor technology, particularly in the detection of defects in circuitry.

Latest Patents

Kara holds a patent for her invention titled "Detection of defects using transient contrast." This innovative method involves performing scans of circuitry formed on a semiconductor substrate using a primary electron beam. The process includes detecting secondary electrons emitted during these scans to create voltage-contrast images. By comparing these images, electrically-active defects can be identified, showcasing her expertise in enhancing semiconductor reliability.

Career Highlights

Kara is currently employed at Kla-Tencor Technologies Corporation, where she applies her knowledge and skills to advance semiconductor technology. Her work has been pivotal in improving defect detection methods, which are crucial for the integrity of electronic devices.

Collaborations

Kara has collaborated with notable colleagues, including John Fretwell and Robert W. Fiordalice. These partnerships have contributed to her innovative approaches and the successful development of her patented technology.

Conclusion

Kara Lee Sherman exemplifies the spirit of innovation in the semiconductor industry. Her contributions, particularly in defect detection, highlight her role as a leading inventor in her field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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