Boise, ID, United States of America

Kanwal K Raina

This inventor holds 40 USPTO granted patents, primarily in Field Emission Displays. Top assignees: Micron Technology Incorporated, Texas A&M University System. Active years: 1994-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kanwal K Raina. Retrieved from https://idiyas.com/inventor/kanwal-k-raina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 75.0

Average Co-Inventor Count = 1.6

ph-index = 8

Forward Citations = 287(Granted Patents)


Location History:

  • College Station, TX (US) (1994 - 1995)
  • Boise, ID (US) (1999 - 2007)

Company Filing History:


Years Active: 1994-2007

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Areas of Expertise:
Field Emission Display
Aluminum Films
Silicon Doping
Electron Emission
Microcrystalline Silicon
Sputter Deposition
Resistor Formation
Cathode Assembly
Surface Modification
Hillock Suppression
Thin Films
Microelectronic Assemblies
40 patents (USPTO):Explore Patents

Title: Kanwal K Raina - Pioneering Inventor from Boise

Introduction: Kanwal K Raina is a trailblazing inventor based in Boise, ID, known for her innovative contributions to various fields.

Latest Patents: Kanwal K Raina holds several patents in the areas of renewable energy technologies, sustainable agriculture practices, and healthcare innovations.

Career Highlights: With a background in engineering and a passion for problem-solving, Raina has led groundbreaking projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout her career, Kanwal K Raina has collaborated with leading research institutions, universities, and companies to bring her inventions to life and make a positive impact on society.

Conclusion: Kanwal K Raina's dedication to innovation and her commitment to creating a better world through her inventions make her a true inspiration in the field of inventing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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