Kang-yi Lien

Title: Kang-yi Lien: Innovator in Semiconductor Technology

Introduction

Kang-yi Lien is an inventor based in Tainan, Taiwan. He is known for his contributions to semiconductor technology, focusing on innovative methods and structures that enhance device performance. Although he currently holds no granted patents, his work in the field is noteworthy.

Latest Patent Applications

Kang-yi Lien has submitted several patent applications that showcase his inventive capabilities. One of his latest applications is titled "THICK REDISTRIBUTION LAYER FEATURES," which describes semiconductor structures and methods of forming them. This application details a semiconductor structure that includes a metal feature in a dielectric layer, a passivation structure over the dielectric layer and the metal feature, a contact pad over the passivation structure, and a plurality of contact vias extending through the passivation structure, connecting with both the metal feature and the contact pad. Another significant application is "METHOD AND SYSTEM FOR DETECTING SEMICONDUCTOR DEVICE." This application outlines a method and system for detecting semiconductor devices, which involves obtaining an image of the device, evaluating features of the image, detecting defects based on these features, extracting defect information, calculating a defect die ratio (DDR), and analyzing the relationship between the DDR and the defect information.

Conclusion

Kang-yi Lien is an emerging inventor in the semiconductor field, with innovative applications that have the potential to impact the industry significantly. His focus on advanced semiconductor structures and detection methods highlights his commitment to technological advancement.