Sassenage, France

Kaiss Benhadjsalem

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Unity Semiconductor Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaiss Benhadjsalem. Retrieved from https://idiyas.com/inventor/kaiss-benhadjsalem

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Kaiss Benhadjsalem

Introduction

Kaiss Benhadjsalem is a notable inventor based in Sassenage, France. He has made significant contributions to the field of optical inspection technology. His innovative approach has led to the development of a unique system that enhances the efficiency of substrate inspection.

Latest Patents

Kaiss holds a patent for a "System for optical inspection of a substrate using same or different wavelengths." This system comprises an illumination device that defines an inspection area on the substrate, a support to receive the substrate, and a detection device that defines a detection area on the substrate. The design ensures that the inspection area is positioned ahead of at least a portion of the detection area, optimizing the scanning process.

Career Highlights

Kaiss is currently associated with Unity Semiconductor Corporation, where he applies his expertise in optical inspection technologies. His work has been instrumental in advancing the capabilities of the company in the semiconductor industry.

Collaborations

Kaiss collaborates with talented individuals such as Mayeul Durand De Gevigney and Guillaume Vienne. Their combined efforts contribute to the innovative projects at Unity Semiconductor Corporation.

Conclusion

Kaiss Benhadjsalem's contributions to optical inspection technology exemplify the spirit of innovation. His patent and work at Unity Semiconductor Corporation highlight his role as a key player in advancing this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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