For the Inventor, By the Inventor

Enter inventor name

Yokohama, Japan

Junzou Azuma

This inventor holds 18 USPTO granted patents, primarily in Charged Particle Beam Processing. Top assignee: Hitachi, Ltd.. Active years: 1991-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junzou Azuma. Retrieved from https://idiyas.com/inventor/junzou-azuma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 18

% Patents Active = 100.0

Average Co-Inventor Count = 5.9

ph-index = 15

Forward Citations = 1,254(Granted Patents)

Location History:

Yokohama, JP (1991 - 1998)
Ebina, JP (1999 - 2003)

Company Filing History:

18 out of 42,760

Years Active: 1991-2003

Loading Chart...

Areas of Expertise:

Charged Particle Beam

Ion Beam Processing

Sample Processing

Plasma Processing

Optical Mask

Phase Shift Mask

Focused Energy Beam

Electron Beam Imaging

Milling Endpoint Detection

Light Irradiation

Pattern Formation

Reactive Gases

18 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6587581 - Visual inspection method and apparatus therefor (2003-07-01),

2. 6507029 - Sample processing apparatus and method for removing charge on sample through light irradiation (2003-01-14),

3. 6476387 - Method and apparatus for observing or processing and analyzing using a charged beam (2002-11-05),

4. 6344115 - Pattern forming method using charged particle beam process and charged particle beam processing system (2002-02-05),

5. 6303932 - Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam (2001-10-16),

6. 5976328 - Pattern forming method using charged particle beam process and charged (1999-11-02),

7. 5952658 - Method and system for judging milling end point for use in charged (1999-09-14),

8. 5825035 - Processing method and apparatus using focused ion beam generating means (1998-10-20),

9. 5683547 - Processing method and apparatus using focused energy beam (1997-11-04),

10. 5583344 - Process method and apparatus using focused ion beam generating means (1996-12-10),

11. 5504340 - Process method and apparatus using focused ion beam generating means (1996-04-02),

12. 5447614 - Method of processing a sample using a charged beam and reactive gases (1995-09-05),

13. 5439763 - Optical mask and method of correcting the same (1995-08-08),

14. 5358806 - Phase shift mask, method of correcting the same and apparatus for (1994-10-25),

15. 5342448 - Apparatus for processing a sample using a charged beam and reactive gases (1994-08-30),

Title: Junzou Azuma - Pioneering Inventor from Yokohama

Introduction: Junzou Azuma is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Azuma's latest patents include innovative designs in robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over three decades, Azuma has worked with leading research institutions and tech companies, consistently pushing the boundaries of innovation. His inventions have revolutionized industries and improved the quality of life for many.

Collaborations: Azuma has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence. His partnerships have led to the development of cutting-edge technologies that have received international acclaim.

Conclusion: Junzou Azuma's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor. His impact on the world of technology is profound, and his legacy continues to inspire future generations of inventors.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…