Junqing (Jenny) Huang

Title: Innovations of Junqing (Jenny) Huang

Introduction

Junqing (Jenny) Huang is a notable inventor based in Fremont, CA. He has made significant contributions to the field of wafer inspection technology. With a total of four patents to his name, Huang has demonstrated his expertise and innovative spirit in the industry.

Latest Patents

Huang's latest patents focus on systems and methods for detecting defects on a wafer. One of the methods involves generating output for a wafer by scanning it with an inspection system that utilizes first and second optical states. These optical states are defined by different values for at least one optical parameter of the inspection system. The method includes generating first image data for the wafer using the output from the first optical state and second image data using the output from the second optical state. Furthermore, the method combines the first and second image data corresponding to the same locations on the wafer, creating additional image data. This additional data is then used to detect defects on the wafer effectively.

Career Highlights

Huang is currently employed at KLA-Tencor Corporation, a leading company in the semiconductor industry. His work at KLA-Tencor has allowed him to apply his innovative ideas and contribute to advancements in wafer inspection technology.

Collaborations

Huang has collaborated with several talented individuals in his field, including Lu Chen and Jason Kirkwood. These collaborations have further enhanced his work and contributed to the success of his projects.

Conclusion

Junqing (Jenny) Huang is a prominent inventor whose work in wafer inspection technology has led to significant advancements in the industry. His innovative methods for detecting defects on wafers showcase his expertise and commitment to improving technology.