Anyang, South Korea

Jung Jin Seo

This inventor holds 1 USPTO granted patent. Top assignee: Eo Technics Co., Ltd. Active years: 2019.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Jung Jin Seo in Wafer Marking Technology

Introduction

Jung Jin Seo is a notable inventor based in Anyang, South Korea. He has made significant contributions to the field of semiconductor manufacturing, particularly in the area of wafer marking technology. His innovative approach has led to the development of a unique method that enhances the efficiency of wafer dicing processes.

Latest Patents

Jung Jin Seo holds a patent for a "Marking method for wafer dice." This patent discloses a method for marking a plurality of wafer dice that have been divided by a wafer dicing process. The method involves several steps, including setting multiple scan regions on the wafer, scanning these regions using a line scan camera, and collecting position information for each wafer die. The process culminates in marking each wafer die using a laser marker, ensuring precision and accuracy in the manufacturing process.

Career Highlights

Jung Jin Seo is associated with Eo Technics Co., Ltd., a company known for its advancements in laser technology and semiconductor equipment. His work at Eo Technics has positioned him as a key player in the development of innovative solutions for the semiconductor industry.

Collaborations

Jung Jin Seo collaborates with talented professionals such as Sun Jung Kim and Jae Man Choi. Their combined expertise contributes to the ongoing advancements in wafer marking technology and enhances the overall capabilities of their team.

Conclusion

Jung Jin Seo's contributions to wafer marking technology exemplify the spirit of innovation in the semiconductor industry. His patented method not only improves efficiency but also sets a new standard for precision in wafer dicing processes.

Profile summary based on public USPTO records.
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