Taipei, Taiwan

Jung-Hao Yang

USPTO Granted Patents = 18 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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18 patents (USPTO):Explore Patents

Title: Innovations by Jung-Hao Yang: Advancements in Depth Estimation and Product Defect Detection

Introduction

Jung-Hao Yang is a prominent inventor based in New Taipei, Taiwan, recognized for his significant contributions to technology through his patents. With a total of 11 patents to his name, he has made substantial strides in the fields of depth estimation and product defect detection, enhancing accuracy and efficiency in various applications.

Latest Patents

Among Jung-Hao Yang's latest innovations are two notable patents. The first patent involves a Method for Training Depth Estimation Model, Electronic Device, and Readable Storage Medium. This innovative method entails obtaining a first left image and a first right image to derive a disparity map through input into a depth estimation model. A second right image is produced by adding the first left image to the disparity map, while a third right image is generated from the initial left image. Binarization processing of the third right image yields a mask image. The training of the depth estimation model is iteratively refined based on the loss value obtained from calculating the mean square error among the pixel values of the first right image, second right image, and mask image.

The second patent is a Method for Detecting Product Defect in Detection Image, Computing Device, and Storage Medium. In this method, a detection image of a product is acquired, and multiple detection blocks are extracted from it. These blocks are input into an auto-encoder, which reconstructs them while a mean square error is computed. This error establishes associations with each detection block, allowing for determination of any defects in the product based on the calculated mean square errors. This method notably improves the accuracy of product defect detection.

Career Highlights

Jung-Hao Yang works at Hon Hai Precision Industry Co., Ltd., a leader in manufacturing and technology solutions. His role within this prestigious company has enabled him to explore innovative solutions and contribute considerably to the industry.

Collaborations

Throughout his career, Jung-Hao has collaborated with talented individuals such as Chin-Pin Kuo and Chih-Te Lu. These partnerships have fostered an environment for innovative thinking and have played a crucial role in the advancement of their joint projects and patents.

Conclusion

Jung-Hao Yang continues to be a trailblazer in technology, pushing the boundaries of depth estimation and product defect detection through his innovative patents. His work at Hon Hai Precision Industry Co., Ltd. and his collaborations reflect a commitment to enhancing technology and improving industry standards. With a promising trajectory ahead, Jung-Hao's contributions will undoubtedly influence future technological advancements.

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