Method for generating defective image, electronic device using the same

Abstract

A method for generating defective image of products applied in an electronic device includes generating first input data according to flawless sample images and a first noise vector, using an autoencoder as a generator of a Generative Adversarial Network (GAN), inputting the first input data to the generator, and generating images for training in defects. The method further includes calculating a first loss value between the flawless sample images and the defect training images, inputting the defect training images into a discriminator of the GAN, and calculating a second loss value. The method further includes obtaining an optimized GAN and taking the optimized GAN as a defective image adversarial network, obtaining flawless testing images, inputting the flawless testing images and a second noise into a generator of the defective image adversarial network, and generating images of defects by processing the flawless testing images and the second noise.