The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jan. 10, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Tzu-Chen Lin, New Taipei, TW;
Jung-Hao Yang, New Taipei, TW;
Chih-Te Lu, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for measuring a growth height of a plant, an electronic device, and a storage medium are provided. The method controls a camera device to obtain a color image and a depth image of a plant to be detected. The color image is detected by a detection model which is pre-trained, and a plurality of detection boxes which includes a plurality of plants to be detected is obtained. The color image and the depth image are aligned to create an alignment image. A plurality of target boxes is acquired from the alignment image, and depth values of the plurality of target boxes are determined. The quantity of the target boxes and a height of one or more plants to be detected are determined, no manual operations are required.