The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Dec. 23, 2021
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jung-Hao Yang, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
Chih-Te Lu, New Taipei, TW;
Tzu-Chen Lin, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
In a product defect detection method, a detection image of a product is obtained. A first preset number of detection blocks are cut out from the detection image. The detection blocks are input into an auto-encoder to obtain reconstructed blocks and a mean square error between each detection block and the corresponding reconstructed block is calculated, an association between the mean square error and the detection block being established. Whether the product carries defective is determined according to the mean square error of each detection block. The method improves accuracy of detecting defects of the product.