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For the Inventor, By the Inventor

Shanghai, China

Jun Chi Yan

This inventor holds 38 USPTO granted patents and 4 published patent applications and 3 EPO patents, primarily in Object Detection. Top assignees: International Business Machines Corporation, Hon Hai Precision Industry Co., Ltd., Hongfujin Precision Electronics (Zhengzhou) Co., Ltd.. Active years: 2015-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Chi Yan. Retrieved from https://idiyas.com/inventor/jun-chi-yan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 38 

% Patents Active = 52.6

 

Average Co-Inventor Count = 4.8

ph-index = 4

Forward Citations = 77(Granted Patents)


Location History:

  • Changning, CN (2019)
  • Zhengzhou, CN (2022)
  • Qingdao, CN (2022)
  • Shanghai, CN (2015 - 2024)

Company Filing History:

goldMedal27 out of 166,325 
 
International Business Machines Corporation
 patents
silverMedal5 out of 19,792 
 
Hon Hai Precision Industry Co., Ltd.
 patents
bronzeMedal4 out of 80 
 
Hongfujin Precision Electronics (Zhengzhou) Co., Ltd.
 patents
4. 3 out of 1,561 
 
Boehringer Ingelheim International Gmbh
 patents
5. 1 out of 168 
 
Ambit Microsystems (Shanghai) Ltd.
 patents
6. 1 out of 1 
 
Shanghai Fenqi Industrial Co., Ltd.
 patent
7. 2 out of 834,453 
Other
 patents
where one patent can have more than one assignee

Years Active: 2015-2025

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Areas of Expertise:
Automatic Feeding System
Data Classification
Object Detection
Machine Learning
Defect Detection
Trajectory Detection
Thermal Image Processing
Quality Evaluation
Pattern Recognition
Wireless Access Points
Expense Compliance
38 patents (USPTO):Explore Patents
1. 12286287 - Automatic feeding system (2025-04-29),
2. D1045595 - Packing box (2024-10-08),
3. D1044493 - Packing box (2024-10-01),
4. 11860911 - Method and apparatus of data classification for routes in a digitized map (2024-01-02),
5. 11756185 - Product defect detection (2023-09-12),
6. 11524834 - Receiving structure and automatic feeding system (2022-12-13),
7. 11443226 - Training a machine learning model in a distributed privacy-preserving environment (2022-09-13),
8. 11384502 - Concrete inside interface processing structure and method for secant pile construction (2022-07-12),
9. 11227341 - Expense compliance checking based on trajectory detection (2022-01-18),
10. 11221107 - Method for leakage detection of underground pipeline corridor based on dynamic infrared thermal image processing (2022-01-11),
11. 11176624 - Privacy-preserving smart metering (2021-11-16),
12. 10964015 - Product defect detection (2021-03-30),
13. 10956796 - Self-guided object detection in regular images (2021-03-23),
14. 10726540 - Self-similarity analysis for defect detection on patterned industrial objects (2020-07-28),
15. 10706530 - Object detection (2020-07-07),

Title: Inventor Jun Chi Yan - Revolutionizing Technology in Shanghai

Introduction: Jun Chi Yan is a visionary inventor based in Shanghai, China, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Jun Chi Yan holds several patents in the areas of artificial intelligence, renewable energy, and biotechnology, showcasing his diverse range of expertise and innovative spirit.

Career Highlights: With a career spanning over two decades, Jun Chi Yan has worked with leading tech companies in Shanghai, driving forward cutting-edge projects and spearheading research initiatives that have pushed the boundaries of technological advancement.

Collaborations: Throughout his career, Jun Chi Yan has collaborated with top research institutions and universities in Shanghai, fostering a culture of innovation and knowledge-sharing that has led to significant breakthroughs in various industries.

Conclusion: Jun Chi Yan's relentless pursuit of innovation and his passion for creating a better future through technology make him a true pioneer in the field of inventions. His work continues to inspire the next generation of inventors and researchers in Shanghai and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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